@misc{indiciae28f8eeebe362,
  title = {Lateral lattice coherence lengths in thin films of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical diffraction in monochromator crystals},
  author = {Sergio L. Morelhao and Stefan Kycia and Samuel Netzke and Celso I. Fornari and Paulo H. O. Rappl and Eduardo Abramof},
  year = {2019},
  url = {https://arxiv.org/abs/1911.00396},
  note = {Source identifier: 1911.00396}
}