TY  - RPRT
TI  - Lateral lattice coherence lengths in thin films of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical diffraction in monochromator crystals
AU  - Sergio L. Morelhao
AU  - Stefan Kycia
AU  - Samuel Netzke
AU  - Celso I. Fornari
AU  - Paulo H. O. Rappl
AU  - Eduardo Abramof
PY  - 2019
UR  - https://arxiv.org/abs/1911.00396
ID  - 1911.00396
ER  -