@misc{indiciaee4c7db2d5e15,
  title = {Advanced chemical state studies of oxide films by lab-based HAXPES combining soft and hard X-ray sources},
  author = {S. Siol and J. Mann and J. Newman and T. Miyayama and K. Watanabe and P. Schmutz and C. Cancellieri and L. P. H. Jeurgens},
  year = {2019},
  doi = {10.1002/sia.6790},
  url = {https://arxiv.org/abs/1911.00428},
  note = {Source identifier: 1911.00428}
}