@misc{indiciae2bbe70d6b77f,
  title = {The Exit-Wave Power-Cepstrum Transform for Scanning Nanobeam Electron Diffraction: Robust Strain Mapping at Subnanometer Resolution and Subpicometer Precision},
  author = {Elliot Padgett and Megan E. Holtz and Paul Cueva and Yu-Tsun Shao and Eric Langenberg and Darrell G. Schlom and David A. Muller},
  year = {2020},
  doi = {10.1016/j.ultramic.2020.112994},
  url = {https://arxiv.org/abs/1911.00984},
  note = {Source identifier: 1911.00984}
}