TY  - RPRT
TI  - The Exit-Wave Power-Cepstrum Transform for Scanning Nanobeam Electron Diffraction: Robust Strain Mapping at Subnanometer Resolution and Subpicometer Precision
AU  - Elliot Padgett
AU  - Megan E. Holtz
AU  - Paul Cueva
AU  - Yu-Tsun Shao
AU  - Eric Langenberg
AU  - Darrell G. Schlom
AU  - David A. Muller
PY  - 2020
DO  - 10.1016/j.ultramic.2020.112994
UR  - https://arxiv.org/abs/1911.00984
ID  - 1911.00984
ER  -