TY  - RPRT
TI  - Trapping of electrons around nanoscale metallic wires embedded in a semiconductor medium
AU  - Chi Cuong Huynh
AU  - R. Evrard
AU  - Ngoc Duy Nguyen
PY  - 2019
UR  - https://arxiv.org/abs/1911.03720
ID  - 1911.03720
ER  -