TY  - RPRT
TI  - Exploiting Oxide Based Resistive RAM Variability for Bayesian Neural Network Hardware Design
AU  - Akul Malhotra
AU  - Sen Lu
AU  - Kezhou Yang
AU  - Abhronil Sengupta
PY  - 2020
DO  - 10.1109/tnano.2020.2982819
UR  - https://arxiv.org/abs/1911.08555
ID  - 1911.08555
ER  -