@misc{indiciaef3008c0a2817,
  title = {Reliability studies of electronic components for the operation at cryogenic temperature},
  author = {N. Poonthottathil and F. Krennrich and J. Eisch and A. Weinstein and L. J Bond and D. Barnard and Z. Zhang and L Koester},
  year = {2019},
  url = {https://arxiv.org/abs/1911.10285},
  note = {Source identifier: 1911.10285}
}