TY  - RPRT
TI  - Resistance Drift in Ge2Sb2Te5 Phase Change Memory Line Cells at Low Temperatures and Its Response to Photoexcitation
AU  - Raihan Sayeed Khan
AU  - Faruk Dirisaglik
AU  - Ali Gokirmak
AU  - Helena Silva
PY  - 2020
UR  - https://arxiv.org/abs/1912.04480
ID  - 1912.04480
ER  -