TY  - RPRT
TI  - A numerical ellipsometric analysis (NEA) of nanoscale layered systems
AU  - Giuseppe Emanuele Lio
AU  - Giovanna Palermo
AU  - Roberto Caputo
AU  - Antonio De Luca
PY  - 2019
DO  - 10.1039/c9ra03684a
UR  - https://arxiv.org/abs/1912.05717
ID  - 1912.05717
ER  -