TY  - RPRT
TI  - Validating the Critical Point of Spontaneous Parametric Down-Conversion for over 600 Scanning MEMS Micro Mirrors on Wafer-Level
AU  - Ulrike Nabholz
AU  - Florian Stockmar
AU  - Jan E. Mehner
AU  - Peter Degenfeld-Schonburg
PY  - 2020
DO  - 10.1109/lsens.2020.2964384
UR  - https://arxiv.org/abs/1912.06189
ID  - 1912.06189
ER  -