TY  - RPRT
TI  - Influence of the growth interface shape on the defect characteristics in the facet region of 4H-SiC single crystals
AU  - Matthias Arzig
AU  - Michael Salamon
AU  - Ta Ching Hsiao
AU  - Norman Uhlmann
AU  - Peter J. Wellmann
PY  - 2019
DO  - 10.1016/j.jcrysgro.2019.125436
UR  - https://arxiv.org/abs/1912.06506
ID  - 1912.06506
ER  -