TY  - RPRT
TI  - Effects of diagonal strains and H-bond geometry in antiferroelectric squaric acid crystals
AU  - A. P. Moina
PY  - 2020
DO  - 10.5488/cmp.23.33704
UR  - https://arxiv.org/abs/1912.06827
ID  - 1912.06827
ER  -