@misc{indiciaec5dac7f9c117,
  title = {Impact of stacking faults and domain boundaries on the electronic transport in cubic silicon carbide probed by conductive atomic force microscopy},
  author = {F. Giannazzo and G. Greco and S. Di Franco and P. Fiorenza and I. Deretzis and A. La Magna and C. Bongiorno and M. Zimbone and F. La Via and M. Zielinski and F. Roccaforte},
  year = {2020},
  doi = {10.1002/aelm.201901171},
  url = {https://arxiv.org/abs/1912.12326},
  note = {Source identifier: 1912.12326}
}