TY  - RPRT
TI  - Effect of memory electrical switching in metal/vanadium oxide/silicon structures with VO2 films obtained by the sol-gel method
AU  - Andrei Velichko
AU  - Alexander Pergament
AU  - Vadim Putrolaynen
AU  - Olga Berezina
AU  - Genrih Stefanovich
PY  - 2020
DO  - 10.1016/j.mssp.2014.05.042
UR  - https://arxiv.org/abs/2001.03055
ID  - 2001.03055
ER  -