TY  - RPRT
TI  - Accurately Determining Defect Ionization Energy in Low-Dimensional Semiconductors: Charge Corrected Jellium Model
AU  - Guo-jun Zhu
AU  - Xin-Gao Gong
AU  - Ji-Hui Yang
PY  - 2020
DO  - 10.1103/physrevb.102.035202
UR  - https://arxiv.org/abs/2001.03895
ID  - 2001.03895
ER  -