@misc{indiciaed60edc936d5e,
  title = {Electron trapping at SiO2/4H-SiC interface probed by transient capacitance measurements and atomic resolution chemical analysis},
  author = {Patrick Fiorenza and Ferdinando Iucolano and Giuseppe Nicotra and Corrado Bongiorno and Ioannis Deretzis and Antonino La Magna and Filippo Giannazzo and Mario Saggio and Corrado Spinella and Fabrizio Roccaforte},
  year = {2020},
  doi = {10.1088/1361-6528/aad129},
  url = {https://arxiv.org/abs/2001.04712},
  note = {Source identifier: 2001.04712}
}