@misc{indiciaec88d8c33a043,
  title = {Scanned single-electron probe inside a silicon electronic device},
  author = {Kevin S. H. Ng and Benoit Voisin and Brett C. Johnson and Jeffrey C. McCallum and Joe Salfi and Sven Rogge},
  year = {2020},
  doi = {10.1021/acsnano.0c00736},
  url = {https://arxiv.org/abs/2001.10225},
  note = {Source identifier: 2001.10225}
}