@misc{indiciae84addc1cea8d,
  title = {Origin and nature of killer defects in 3C-SiC for power electronic applications by a multiscale atomistic approach},
  author = {Emilio Scalise and Luca Barbisan and Andrey Sarikov and Francesco Montalenti and Leo Miglio and Anna Marzegalli},
  year = {2020},
  url = {https://arxiv.org/abs/2001.11826},
  note = {Source identifier: 2001.11826}
}