TY  - RPRT
TI  - Origin and nature of killer defects in 3C-SiC for power electronic applications by a multiscale atomistic approach
AU  - Emilio Scalise
AU  - Luca Barbisan
AU  - Andrey Sarikov
AU  - Francesco Montalenti
AU  - Leo Miglio
AU  - Anna Marzegalli
PY  - 2020
UR  - https://arxiv.org/abs/2001.11826
ID  - 2001.11826
ER  -