TY  - RPRT
TI  - Estimation of Z-Thickness and XY-Anisotropy of Electron Microscopy Images using Gaussian Processes
AU  - Thanuja D. Ambegoda
AU  - Julien N. P. Martel
AU  - Jozef Adamcik
AU  - Matthew Cook
AU  - Richard H. R. Hahnloser
PY  - 2020
UR  - https://arxiv.org/abs/2002.00228
ID  - 2002.00228
ER  -