TY  - RPRT
TI  - The Investigation of Negative Capacitance Vertical Nanowire FETs Based on SPICE Model at Device-Circuit Level
AU  - Weixing Huang
AU  - Huilong Zhu
AU  - Kunpeng Jia
AU  - Zhenhua Wu
AU  - Xiaogen Yin
AU  - Qiang Huo
AU  - Yongkui Zhang
PY  - 2020
UR  - https://arxiv.org/abs/2002.03726
ID  - 2002.03726
ER  -