TY  - RPRT
TI  - Robust multi-scale multi-feature deep learning for atomic and defect identification in Scanning Tunneling Microscopy on H-Si(100) 2x1 surface
AU  - Maxim Ziatdinov
AU  - Udi Fuchs
AU  - James H. G. Owen
AU  - John N. Randall
AU  - Sergei V. Kalinin
PY  - 2020
UR  - https://arxiv.org/abs/2002.04716
ID  - 2002.04716
ER  -