TY  - RPRT
TI  - Characterization of High-Purity Germanium (Ge) Crystals for Developing Novel Ge Detectors
AU  - M. -S. Raut
AU  - H. Mei
AU  - D. -M. Mei
AU  - S. Bhattarai
AU  - W. -Z. Wei
AU  - R. Panda
AU  - P. Acharya
AU  - G. -J. Wang
PY  - 2020
DO  - 10.1088/1748-0221/15/10/t10010
UR  - https://arxiv.org/abs/2002.07706
ID  - 2002.07706
ER  -