TY  - RPRT
TI  - Investigation of the Electrical Conduction Mechanisms in P-type Amorphous Germanium (a-Ge) Used as a-Ge Contacts for Ge Detectors
AU  - S. Bhattarai
AU  - R. Panth
AU  - W. -Z. Wei
AU  - H. Mei
AU  - D. -M. Mei
AU  - M. S. Raut
AU  - P. Acharya
AU  - W. -J. Wang
PY  - 2020
UR  - https://arxiv.org/abs/2002.07707
ID  - 2002.07707
ER  -