TY  - RPRT
TI  - Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits
AU  - Thomas Lange
AU  - Aneesh Balakrishnan
AU  - Maximilien Glorieux
AU  - Dan Alexandrescu
AU  - Luca Sterpone
PY  - 2020
DO  - 10.1109/iolts.2019.8854423
UR  - https://arxiv.org/abs/2002.08882
ID  - 2002.08882
ER  -