@misc{indiciae0e8afce7429e,
  title = {On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques},
  author = {Thomas Lange and Aneesh Balakrishnan and Maximilien Glorieux and Dan Alexandrescu and Luca Sterpone},
  year = {2020},
  doi = {10.1109/dsn-s.2019.00021},
  url = {https://arxiv.org/abs/2002.09945},
  note = {Source identifier: 2002.09945}
}