TY  - RPRT
TI  - On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques
AU  - Thomas Lange
AU  - Aneesh Balakrishnan
AU  - Maximilien Glorieux
AU  - Dan Alexandrescu
AU  - Luca Sterpone
PY  - 2020
DO  - 10.1109/dsn-s.2019.00021
UR  - https://arxiv.org/abs/2002.09945
ID  - 2002.09945
ER  -