@misc{indiciaed870422d5e4b,
  title = {Fault Diagnosis in Microelectronics Attachment via Deep Learning Analysis of 3D Laser Scans},
  author = {Nikolaos Dimitriou and Lampros Leontaris and Thanasis Vafeiadis and Dimosthenis Ioannidis and Tracy Wotherspoon and Gregory Tinker and Dimitrios Tzovaras},
  year = {2020},
  doi = {10.1109/tie.2019.2931220},
  url = {https://arxiv.org/abs/2002.10974},
  note = {Source identifier: 2002.10974}
}