TY  - RPRT
TI  - Fault Diagnosis in Microelectronics Attachment via Deep Learning Analysis of 3D Laser Scans
AU  - Nikolaos Dimitriou
AU  - Lampros Leontaris
AU  - Thanasis Vafeiadis
AU  - Dimosthenis Ioannidis
AU  - Tracy Wotherspoon
AU  - Gregory Tinker
AU  - Dimitrios Tzovaras
PY  - 2020
DO  - 10.1109/tie.2019.2931220
UR  - https://arxiv.org/abs/2002.10974
ID  - 2002.10974
ER  -