@misc{indiciaee5f4232d965e,
  title = {A Deep Learning Framework for Simulation and Defect Prediction Applied in Microelectronics},
  author = {Nikolaos Dimitriou and Lampros Leontaris and Thanasis Vafeiadis and Dimosthenis Ioannidis and Tracy Wotherspoon and Gregory Tinker and Dimitrios Tzovaras},
  year = {2020},
  doi = {10.1016/j.simpat.2019.102063},
  url = {https://arxiv.org/abs/2002.10986},
  note = {Source identifier: 2002.10986}
}