TY  - RPRT
TI  - A Deep Learning Framework for Simulation and Defect Prediction Applied in Microelectronics
AU  - Nikolaos Dimitriou
AU  - Lampros Leontaris
AU  - Thanasis Vafeiadis
AU  - Dimosthenis Ioannidis
AU  - Tracy Wotherspoon
AU  - Gregory Tinker
AU  - Dimitrios Tzovaras
PY  - 2020
DO  - 10.1016/j.simpat.2019.102063
UR  - https://arxiv.org/abs/2002.10986
ID  - 2002.10986
ER  -