@misc{indiciaeac52d1d76cd5,
  title = {Thickness dependence of electronic structure and optical properties of a correlated van der Waals antiferromagnet NiPS\$\_3\$ thin film},
  author = {Christopher Lane and Jian-Xin Zhu},
  year = {2020},
  doi = {10.1103/physrevb.102.075124},
  url = {https://arxiv.org/abs/2003.01614},
  note = {Source identifier: 2003.01614}
}