TY  - RPRT
TI  - Thickness dependence of electronic structure and optical properties of a correlated van der Waals antiferromagnet NiPS$_3$ thin film
AU  - Christopher Lane
AU  - Jian-Xin Zhu
PY  - 2020
DO  - 10.1103/physrevb.102.075124
UR  - https://arxiv.org/abs/2003.01614
ID  - 2003.01614
ER  -