TY  - RPRT
TI  - Spin transport in Si-based spin metal-oxide-semiconductor field-effect transistors: Spin drift effect in the inversion channel and spin relaxation in the n+-Si source/drain regions
AU  - Shoichi Sato
AU  - Masaaki Tanaka
AU  - Ryosho Nakane
PY  - 2020
DO  - 10.1103/physrevb.102.035305
UR  - https://arxiv.org/abs/2003.02415
ID  - 2003.02415
ER  -