@misc{indiciae9ed6aea7232e,
  title = {Quantifying Defects in Thin Films using Machine Vision},
  author = {Nina Taherimakhsousi and Benjamin P. MacLeod and Fraser G. L. Parlane and Thomas D. Morrissey and Edward P. Booker and Kevan E. Dettelbach and Curtis P. Berlinguette},
  year = {2020},
  url = {https://arxiv.org/abs/2003.04860},
  note = {Source identifier: 2003.04860}
}