@misc{indiciaed447f15a72b4,
  title = {AC Measurement of the Nernst effect of thin films at low temperatures},
  author = {Yuxiao Wu and Aviad Frydman and Arnab Roy},
  year = {2020},
  doi = {10.1063/5.0007653},
  url = {https://arxiv.org/abs/2003.07946},
  note = {Source identifier: 2003.07946}
}