TY  - RPRT
TI  - AC Measurement of the Nernst effect of thin films at low temperatures
AU  - Yuxiao Wu
AU  - Aviad Frydman
AU  - Arnab Roy
PY  - 2020
DO  - 10.1063/5.0007653
UR  - https://arxiv.org/abs/2003.07946
ID  - 2003.07946
ER  -