TY  - RPRT
TI  - Origin of selective enhancement of sharp defect emission lines in monolayer WSe$_2$ on rough metal substrate
AU  - Raghav Chaudhary
AU  - Varun Raghunathan
AU  - Kausik Majumdar
PY  - 2020
DO  - 10.1063/1.5139675
UR  - https://arxiv.org/abs/2003.09692
ID  - 2003.09692
ER  -