@misc{indiciae579d3c7d5992,
  title = {Thermoelectric probe of defect state induced by ionic liquid gating in vanadium dioxide},
  author = {Hui Xing and Peihong Zhang and Hao Zeng},
  year = {2020},
  doi = {10.1063/5.0008723},
  url = {https://arxiv.org/abs/2003.09840},
  note = {Source identifier: 2003.09840}
}