TY  - RPRT
TI  - Thermoelectric probe of defect state induced by ionic liquid gating in vanadium dioxide
AU  - Hui Xing
AU  - Peihong Zhang
AU  - Hao Zeng
PY  - 2020
DO  - 10.1063/5.0008723
UR  - https://arxiv.org/abs/2003.09840
ID  - 2003.09840
ER  -