TY  - RPRT
TI  - An electron-counting rule to determine the interlayer magnetic coupling of the van der Waals materials
AU  - Jiewen Xiao
AU  - Binghai Yan
PY  - 2020
DO  - 10.1088/2053-1583/ab9ea4
UR  - https://arxiv.org/abs/2003.09942
ID  - 2003.09942
ER  -