TY  - RPRT
TI  - A Memory Window Expression to Predict the Scaling Trends and Endurance of FeFETs
AU  - Nicoló Zagni
AU  - Paolo Pavan
AU  - Muhammad Ashraful Alam
PY  - 2020
UR  - https://arxiv.org/abs/2003.12743
ID  - 2003.12743
ER  -