TY  - RPRT
TI  - Critical Evaluation of Relative Importance of Stress and Stress Gradient in Whisker Growth in Tin Coatings
AU  - Piyush Jagtap
AU  - Vijay A. Sethuraman
AU  - Praveen Kumar
PY  - 2020
DO  - 10.1007/s11664-018-6391-6
UR  - https://arxiv.org/abs/2003.13389
ID  - 2003.13389
ER  -