@misc{indiciae3e16223d951c,
  title = {An atomic force microscope integrated with a helium ion microscope for correlative nanocharacterization},
  author = {Santiago H. Andany and Gregor Hlawacek and Stefan Hummel and Charlène Brillard and Mustafa Kangül and Georg E. Fantner},
  year = {2020},
  url = {https://arxiv.org/abs/2004.00536},
  note = {Source identifier: 2004.00536}
}