TY  - RPRT
TI  - An atomic force microscope integrated with a helium ion microscope for correlative nanocharacterization
AU  - Santiago H. Andany
AU  - Gregor Hlawacek
AU  - Stefan Hummel
AU  - Charlène Brillard
AU  - Mustafa Kangül
AU  - Georg E. Fantner
PY  - 2020
UR  - https://arxiv.org/abs/2004.00536
ID  - 2004.00536
ER  -