@misc{indiciaeffb0aedd60d6,
  title = {Characterization of sputtered hafnium thin films for high quality factor microwave kinetic inductance detectors},
  author = {G. Coiffard and M. Daal and N. Zobrist and N. Swimmer and S. Steiger and B. Bumble and B. A. Mazin},
  year = {2020},
  doi = {10.1088/1361-6668/ab8d99},
  url = {https://arxiv.org/abs/2004.00736},
  note = {Source identifier: 2004.00736}
}