TY  - RPRT
TI  - Characterization of sputtered hafnium thin films for high quality factor microwave kinetic inductance detectors
AU  - G. Coiffard
AU  - M. Daal
AU  - N. Zobrist
AU  - N. Swimmer
AU  - S. Steiger
AU  - B. Bumble
AU  - B. A. Mazin
PY  - 2020
DO  - 10.1088/1361-6668/ab8d99
UR  - https://arxiv.org/abs/2004.00736
ID  - 2004.00736
ER  -