TY  - RPRT
TI  - In Situ Study of the Impact of Aberration-Corrected Electron-Beam Lithography on the Electronic Transport of Suspended Graphene Devices
AU  - Naomi Mizuno
AU  - Fernando Camino
AU  - Xu Du
PY  - 2020
DO  - 10.3390/nano10040666
UR  - https://arxiv.org/abs/2004.01309
ID  - 2004.01309
ER  -