@misc{indiciae4fb2a6d26658,
  title = {Temperature overshoot as the cause of physical changes in resistive switching devices during electro-formation},
  author = {Jingjia Meng and Bingyuan Zhao and Jonathan M. Goodwill and James A. Bain and Marek Skowronski},
  year = {2020},
  doi = {10.1063/5.0010882},
  url = {https://arxiv.org/abs/2004.06571},
  note = {Source identifier: 2004.06571}
}